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Spectroscopy Bundle - Thinfilm Measurements

thinfilm measurement bundle

For single layer thin film measurements, this system provides the required tools. It includes a reflection probe and a measurement stage, and it can measure thin films ranging from 10nm to 50μm with a resolution of 1nm. It supports UV/VIS and NIR measurements from 200-1100nm.

Typical applications:

• Semi-conductor industry
• Solar panels
• Coating

Note: Bundle not illustrated in image

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